HITACHI S2600N Scanning Electron Microscope with EDAX probe


  • Analysis of secondary electron image (SEI) resolution until 4 nm (at 25 kV in high vacuum), magnifying domain from 15x to 300000, accelerating voltage from 0.5 kV to 30 kV;
  • Analysis of back scattered electron image resolution until 5 nm (at 25 kV and variable pressure), pressure domain from 1 to 270 Pa, magnifying domain from 15x to 300000x;
  • Qualitative and Quantitative microanalysis by Energy Dispersive X-ray Spectroscopy.

Obtained results