{"id":736,"date":"2020-11-05T07:41:21","date_gmt":"2020-11-05T07:41:21","guid":{"rendered":"https:\/\/www.micronanotech.ro\/difractie-de-raze-x\/"},"modified":"2021-01-05T13:24:39","modified_gmt":"2021-01-05T13:24:39","slug":"difractie-de-raze-x","status":"publish","type":"post","link":"https:\/\/www.micronanotech.ro\/en\/difractie-de-raze-x\/","title":{"rendered":"X-ray diffraction"},"content":{"rendered":"<div class=\"wpb-content-wrapper\"><p>[vc_row][vc_column width=&#8221;5\/6&#8243;][vc_column_text]There are two diffractometers in the laboratory endowment, namely:<\/p>\n<h2>SCHIMADZU XRD 6000 X-ray diffractometer<\/h2>\n<p>Characteristics: Qualitative analyses for the identification of crystalline phases in solid samples, at temperatures in the range of 20 &#8211; 1500\u00b0 C, as well as quantitative analyses on powder mixtures and determination of the crystallinity degree (based on the Lorentz equation); the diffraction range varies between 2\u03b8 = 3 &#8211; 100\u00b0; minimum scanning speed 0.005\u00b0\/ min.[\/vc_column_text][\/vc_column][vc_column width=&#8221;1\/6&#8243;][vc_single_image image=&#8221;633&#8243; img_size=&#8221;full&#8221; alignment=&#8221;center&#8221;][\/vc_column][\/vc_row][vc_row][vc_column width=&#8221;5\/6&#8243;][vc_column_text]<\/p>\n<h2>Panalytical Empyrean X-ray diffractometer<\/h2>\n<p>Characteristics: Qualitative and qualitative analyses for the identifyication of crystalline phases in solid samples with the following characteristics and options: &#8220;fine focus&#8221; anode; high resolution goniometer; angular range between -111 \u00f7 168 degrees; goniometer linearity of \u00b1 0.01\u00b0 (2\u03b8); 2D 256 \u00d7 256 pixel detector; module for SAXS type analyses; 5-axis platform thin film analysis. There can be performed analyses such as: quantitative and qualitative Rietveld and cluster type analysis, manipulation of the results on the graph, peak search, data import\/export, fit-smoothing of diffraction spectra; profile fittings; 2D analysis of Debye circles; search and phase identification, semi-quantitative analysis; refining and unit cell searching and entire profile refining; Rietveld analysis; texture analysis; calculation of the orientation distribution function, pole figures, inverse pole figures; automatic calculation of particle size, distribution and specific surface area; multimodal dimension distribution analysis; possibility to create analytical templates with total control of steps and parameters; determination of thin layer thickness, density, interface parameters between layers, simulation, fitting; visualization and analysis of scans on one or 2 axes: rocking curves, reciprocal space mapping, reflectivity, pole figures, inverse pole figures.[\/vc_column_text][\/vc_column][vc_column width=&#8221;1\/6&#8243;][vc_single_image image=&#8221;634&#8243; img_size=&#8221;full&#8221;][\/vc_column][\/vc_row][vc_row][vc_column][vc_column_text]<\/p>\n<h2>Obtained results<\/h2>\n<p>[\/vc_column_text][vc_row_inner][vc_column_inner width=&#8221;1\/4&#8243;][vc_single_image image=&#8221;635&#8243; img_size=&#8221;300&#215;150&#8243; onclick=&#8221;link_image&#8221;][\/vc_column_inner][vc_column_inner width=&#8221;1\/4&#8243;][vc_single_image image=&#8221;636&#8243; img_size=&#8221;300&#215;150&#8243; onclick=&#8221;link_image&#8221;][\/vc_column_inner][vc_column_inner width=&#8221;1\/4&#8243;][\/vc_column_inner][vc_column_inner width=&#8221;1\/4&#8243;][\/vc_column_inner][\/vc_row_inner][\/vc_column][\/vc_row]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"<p>[vc_row][vc_column width=&#8221;5\/6&#8243;][vc_column_text]There are two diffractometers in the laboratory endowment, namely: SCHIMADZU XRD 6000 X-ray diffractometer Characteristics: Qualitative analyses for the identification of crystalline phases in solid samples, at temperatures in the range of 20 &#8211; 1500\u00b0 C, as well as quantitative analyses on powder mixtures and determination of the crystallinity degree (based on the Lorentz [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":637,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[15],"tags":[],"class_list":["post-736","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-lab-caracterizari-en"],"featured_image_src":{"landsacpe":["https:\/\/www.micronanotech.ro\/wp-content\/uploads\/2020\/11\/difractometru-prw.jpg",280,280,false],"list":["https:\/\/www.micronanotech.ro\/wp-content\/uploads\/2020\/11\/difractometru-prw.jpg",280,280,false],"medium":["https:\/\/www.micronanotech.ro\/wp-content\/uploads\/2020\/11\/difractometru-prw.jpg",280,280,false],"full":["https:\/\/www.micronanotech.ro\/wp-content\/uploads\/2020\/11\/difractometru-prw.jpg",280,280,false]},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.4 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>X-ray diffraction - Micronanotech<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.micronanotech.ro\/en\/difractie-de-raze-x\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"X-ray diffraction - Micronanotech\" \/>\n<meta property=\"og:description\" content=\"[vc_row][vc_column width=&#8221;5\/6&#8243;][vc_column_text]There are two diffractometers in the laboratory endowment, namely: SCHIMADZU XRD 6000 X-ray diffractometer Characteristics: Qualitative analyses for the identification of crystalline phases in solid samples, at temperatures in the range of 20 &#8211; 1500\u00b0 C, as well as quantitative analyses on powder mixtures and determination of the crystallinity degree (based on the Lorentz [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.micronanotech.ro\/en\/difractie-de-raze-x\/\" \/>\n<meta property=\"og:site_name\" content=\"Micronanotech\" \/>\n<meta property=\"article:published_time\" content=\"2020-11-05T07:41:21+00:00\" \/>\n<meta property=\"article:modified_time\" content=\"2021-01-05T13:24:39+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.micronanotech.ro\/wp-content\/uploads\/2020\/11\/difractometru-prw.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"280\" \/>\n\t<meta property=\"og:image:height\" content=\"280\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"Marius B\u0103dican\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Marius B\u0103dican\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/\"},\"author\":{\"name\":\"Marius B\u0103dican\",\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/#\\\/schema\\\/person\\\/393d5a2366e875aa2055519ea537cf2c\"},\"headline\":\"X-ray diffraction\",\"datePublished\":\"2020-11-05T07:41:21+00:00\",\"dateModified\":\"2021-01-05T13:24:39+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/\"},\"wordCount\":367,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.micronanotech.ro\\\/wp-content\\\/uploads\\\/2020\\\/11\\\/difractometru-prw.jpg\",\"articleSection\":[\"Lab caracterizari en\"],\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/\",\"url\":\"https:\\\/\\\/www.micronanotech.ro\\\/en\\\/difractie-de-raze-x\\\/\",\"name\":\"X-ray diffraction - 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