There are two diffractometers in the laboratory endowment, namely:
SCHIMADZU XRD 6000 X-ray diffractometer
Characteristics: Qualitative analyses for the identification of crystalline phases in solid samples, at temperatures in the range of 20 – 1500° C, as well as quantitative analyses on powder mixtures and determination of the crystallinity degree (based on the Lorentz equation); the diffraction range varies between 2θ = 3 – 100°; minimum scanning speed 0.005°/ min.
Panalytical Empyrean X-ray diffractometer
Characteristics: Qualitative and qualitative analyses for the identifyication of crystalline phases in solid samples with the following characteristics and options: “fine focus” anode; high resolution goniometer; angular range between -111 ÷ 168 degrees; goniometer linearity of ± 0.01° (2θ); 2D 256 × 256 pixel detector; module for SAXS type analyses; 5-axis platform thin film analysis. There can be performed analyses such as: quantitative and qualitative Rietveld and cluster type analysis, manipulation of the results on the graph, peak search, data import/export, fit-smoothing of diffraction spectra; profile fittings; 2D analysis of Debye circles; search and phase identification, semi-quantitative analysis; refining and unit cell searching and entire profile refining; Rietveld analysis; texture analysis; calculation of the orientation distribution function, pole figures, inverse pole figures; automatic calculation of particle size, distribution and specific surface area; multimodal dimension distribution analysis; possibility to create analytical templates with total control of steps and parameters; determination of thin layer thickness, density, interface parameters between layers, simulation, fitting; visualization and analysis of scans on one or 2 axes: rocking curves, reciprocal space mapping, reflectivity, pole figures, inverse pole figures.